2021 International Conference on Engineering Education and Information Technology(EEIT 2021)

2021 International Conference on Engineering Education and Information Technology(EEIT 2021)



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Nanjing, China

Mozhou East Road, Jiangning District, Nanjing, Jiangsu, China Mapa

As the workshop of ICTC 2021, the accepted papers of EEIT 2021 will be included into ICTC 2021 Conference Proceedings as a Special Chapter. The paper will be archived in IEEE Xplore, and to be indexed by Ei Compendex and Scopus.
ICTC 2021 is listed in official IEEE Conference Calendar: https://conferences.ieee.org/conferences_events/conferences/conferencedetails/51749

Call for paper
Areas of interest includes, but are not limited to the following tracks:
Track 1: Engineering Education Curriculum Reform
Track 2: Modern Information Theory and Application
Track 3: Engineering education construction and talent training
Track 4: Computer Network and Information Network Technology
For details about topics and our tracks, please visit at http://www.eeit.net/cfp.html

1. Submission by Online Electrical System:
2. send your paper or abstract directly to us by email: eeit_general@163.com
More detail about submission, please visit at http://www.eeit.net/sub.html

Conference Schedule
May 7, 2021 10:00-17:00 | Registration,collecting conference materials
May 8, 2021 09:00-18:00 | Openning Remarks & Keynote Speech & Parallel Sessions
May 9, 2021 09:00-18:00 | Parallel Sessions

Ms. Shell Xiao (Conference Secretary)
E-mail: eeit_general@163.com
Tel: +86-132-9000-0002

Organizing Committee
Advisory Committee Chair:
Zaichen Zhang, Executive Dean, School Of Information Science and Engineering, Southeast University, China
Conference Committees Chair:
W.Y. Dai, Prof. Dr. SIR Forum President & CEO, U.S.A
Conference Co-Chair:
Mounir Ghogho, University of Leeds, UK
Conference Executive Chair:
Chuan Zhang, Southeast University, China
Program Co-Chairs:
Peter Mueller, Chief Scientist, IBM 50 Qubit Quantum Computer, Switzerland;
Pierluigi Siano, Editors of IEEE Trans. and IEEE Journals, University of Salerno, Italy.

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